Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8516229 | Two pass test case generation using self-modifying instruction replacement | Allon Adir, Brad L. Herold, John Martin Ludden, Charles Leverett Meissner, Gil Eliezer Shurek | 2013-08-20 |
| 7836343 | Method and apparatus for reducing test case generation time in processor testing | Guo-Hua Feng | 2010-11-16 |
| 7085980 | Method and apparatus for determining the failing operation of a device-under-test | Charles Leverett Meissner, Michael T. Saunders | 2006-08-01 |
| 6973607 | Method and apparatus for testing electronic components | Heinz Baier, Robert Francis Berry, Michael Criscolo, Michael T. Saunders, Kanti C. Shah | 2005-12-06 |
| 6941504 | Method and apparatus for test case evaluation using a cyclic redundancy checker | Robert W. Berry, Jr., Michael Criscolo, Charles Leverett Meissner, Michael T. Saunders | 2005-09-06 |