Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188961 | Method for accurate pad contact testing | Zheng Xu, Yufei Wu, Myra Ahmad, Nikhilesh C Sahani | 2025-01-07 |
| 11796590 | Localized heating/cooling using thermocouple between probe pins | Pablo Nieves, Reinaldo Vega | 2023-10-24 |
| 11137418 | Device test pad probe card structure with individual probe manipulation capability | Pablo Nieves, Reinaldo Vega | 2021-10-05 |
| 11125780 | Test probe assembly with fiber optic leads and photodetectors | Pablo Nieves, Reinaldo Vega | 2021-09-21 |
| 11119148 | Test probe assembly with fiber optic leads and photodetectors for testing semiconductor wafers | Pablo Nieves, Reinaldo Vega | 2021-09-14 |