Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7089528 | Methods and systems for estimating reticle bias states | David Crow | 2006-08-08 |
| 6912435 | Methods and systems for controlling reticle-induced errors | David Crow, Etienne Joubert | 2005-06-28 |
| 6700950 | Methods and systems for controlling critical dimension (CD) error | David Crow | 2004-03-02 |
| 5444538 | System and method for optimizing the grid and intrafield registration of wafer patterns | — | 1995-08-22 |