Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5248876 | Tandem linear scanning confocal imaging system with focal volumes at different heights | Pieter J. Kerstens, Frederick Y. Wu | 1993-09-28 |
| 5018211 | System for detecting and analyzing rounded objects | Robert S. Jaffe | 1991-05-21 |
| 4853967 | Method for automatic optical inspection analysis of integrated circuits | — | 1989-08-01 |