Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6549150 | Integrated test structure and method for verification of microelectronic devices | Raymond J. Bulaga, Patrick Miller, Mark S. Styduhar, Donald L. Wheater | 2003-04-15 |
JM
John K. Masi
Overall (All Time): #3,508,467 of 4,157,543Top 85%
1
Patents All Time