Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6132632 | Method and apparatus for achieving etch rate uniformity in a reactive ion etcher | Robert Huber, Cherngye Hwang, Diana Perez, John W. Williams | 2000-10-17 |
DH
David Emery Haney
Overall (All Time): #3,630,447 of 4,157,543Top 90%
1
Patents All Time