Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8234601 | Test pattern for contour calibration in OPC model build | Alexander Wei | 2012-07-31 |
AA
Amr A. Abdo
Overall (All Time): #3,217,232 of 4,157,543Top 80%
1
Patents All Time