AB

Akiko F. Balchiunas

IBM: 3 patents #26,272 of 70,183Top 40%
📍 South Burlington, VT: #470 of 1,136 inventorsTop 45%
🗺 Vermont: #1,707 of 4,968 inventorsTop 35%
Overall (All Time): #1,577,130 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
7573284 Increase productivity at wafer test using probe retest data analysis — 2009-08-11
7463047 Increase productivity at wafer test using probe retest data analysis — 2008-12-09
7253650 Increase productivity at wafer test using probe retest data analysis — 2007-08-07