Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6310823 | Circuit for generating internal column strobe signal in synchronous semiconductor memory device | — | 2001-10-30 |
| 6169694 | Circuit and method for fully on-chip wafer level burn-in test | Young-Hee Kim | 2001-01-02 |