Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9804072 | High temperature heating system | Syed Amanulla Syed Asif, Edward Cyrankowski, Lucas Paul Keranen, Ryan Major, Yunje Oh +1 more | 2017-10-31 |
| 9759641 | Micro electro-mechanical heater | Yunje Oh, Syed Amanulla Syed Asif, Edward Cyrankowski | 2017-09-12 |
| 9404841 | Microelectromechanical transducer and test system | Yunje Oh, Syed Amanula Syed Asif | 2016-08-02 |
| 9316569 | Micro electro-mechanical heater | Yunje Oh, Syed Amanulla Syed Asif, Edward Cyrankowski | 2016-04-19 |
| 9304072 | Micromachined comb drive for quantitative nanoindentation | Yunje Oh, Syed Amanula Syed Asif | 2016-04-05 |
| 9157845 | 2-D MEMS tribometer with comb drives | Yunje Oh, Syed Amanula Syed Asif | 2015-10-13 |
| 8959980 | Nanomechanical testing system | David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz +1 more | 2015-02-24 |
| 8939041 | Nanomechanical testing system | David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz +1 more | 2015-01-27 |
| 8844366 | Three dimensional transducer | Syed Amanulla Syed Asif, Yunje Oh, Yuxin Feng, Edward Cyrankowski, Ryan Major | 2014-09-30 |
| 8770036 | Nanomechanical testing system | David James Vodnick, Arpit Dwivedi, Lucas Paul Keranen, Michael David Okerlund, Roger William Schmitz +1 more | 2014-07-08 |
| 8738315 | Digital damping control of nanomechanical test instruments | Yunje Oh, Matthew Robert Wilson, Ryan Major, Syed Amanula Syed Asif | 2014-05-27 |
| 8453498 | Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy | Syed Amanula Syed Asif, Edward Cyrankowski, Kalin Kounev | 2013-06-04 |
| 8161803 | Micromachined comb drive for quantitative nanoindentation | Yunje Oh, Syed Amanula Syed Asif | 2012-04-24 |
| 7798011 | Actuatable capacitive transducer for quantitative nanoindentation combined with transmission electron microscopy | S. A. Syed Asif, Edward Cyrankowski, Kalin Kounev | 2010-09-21 |
| 7425698 | Feedback influenced increased-quality-factor scanning probe microscope | Peter Norton, John Graham | 2008-09-16 |