Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5159408 | Optical thickness profiler using synthetic wavelengths | H. Eugene W. Waldenmaier, G. H. Hayes | 1992-10-27 |
| 5153669 | Three wavelength optical measurement apparatus and method | — | 1992-10-06 |