Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4833676 | Interleaved method and circuitry for testing for stuck open faults | — | 1989-05-23 |
| 4742293 | Pseudo-memory circuit for testing for stuck open faults | Gene W. Lee | 1988-05-03 |