Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5185579 | Detection and ranging of material flaws using microwave transmission line reflectometry | Louis E. Gates, Jr., Ronald I. Wolfson, William W. Milroy, Joseph P. Smalanskas | 1993-02-09 |