Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12111348 | Evaluation module and evaluation method for evaluating multichip module lifespan | Lin Liang, Lubin Han, Xudan Liu, Maojun He | 2024-10-08 |
| 8294472 | Reliability evaluation circuit and reliability evaluation system | Sang Jin KWON, Jae-Hoon Lee, Jong Won Lee | 2012-10-23 |