Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345518 | Method for measuring thickness and optical properties of multi-layer film | ZiQing Li, Jing Lu, Zhongwei Hu, Xipeng Xu, Hui-Chen Huang +1 more | 2025-07-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345518 | Method for measuring thickness and optical properties of multi-layer film | ZiQing Li, Jing Lu, Zhongwei Hu, Xipeng Xu, Hui-Chen Huang +1 more | 2025-07-01 |