Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7483027 | Apparatus and method of cataloging test data by icons | Yoshiyuki Okada, Tatsuo Igushi, Loic Merckel | 2009-01-27 |
| 7180592 | Particle size distribution analyzer | Yoshiyuki Okada | 2007-02-20 |
| 6741350 | Particle size distribution measuring apparatus with validation and instruction modes | Hideyuki Ikeda | 2004-05-25 |