JU

Juichiro Ukon

HO Horiba: 15 patents #5 of 604Top 1%
JS Jobin Yvon Sas: 1 patents #4 of 20Top 20%
NS Nippon Soken: 1 patents #783 of 1,540Top 55%
UN Unknown: 1 patents #29,356 of 83,584Top 40%
Overall (All Time): #221,002 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10918284 Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method Hideo Ando, Toshiaki Iwai, Izumi Nishidate 2021-02-16
10753843 Method and apparatus for measuring gel particle Toru Obata 2020-08-25
10660523 Light-source unit, measurement apparatus, near-infrared microscopic apparatus, optical detection method, imaging method, calculation method, functional bio-related substance, state management method, and manufacturing method Hideo Ando, Toshiaki Iwai, Izumi Nishidate 2020-05-26
10359366 Substrate for surface enhanced Raman scattering spectroscopy and devices using same 2019-07-23
9116116 Optical analyzer and wavelength stabilized laser device for analyzer Takuya Ido, Susumu Mimura 2015-08-25
8704174 Refined oil degradation level measuring instrument and refined oil degradation level measuring method Toshiyuki Tsujimoto 2014-04-22
6943879 Method for monitoring and/or controlling the status of a plasma in a plasma spectrometer and spectrometer for implementing such a method Yves Danthez 2005-09-13
6627155 Combustion furnace system for analyzing elements in a sample Takeshi Uemura, Akihiro Hirano 2003-09-30
5886347 Analytical method for multi-component aqueous solutions and apparatus for the same Masaru Inoue, Issei Yokoyama, Takashi Hagiwara 1999-03-23
5870193 Apparatus for determining kinds of adsorbates Atsuhiro Sumiya, Itsuhei Ogata, Tsukasa Satake 1999-02-09
5745369 Method and apparatus for determining a peak position of a spectrum 1998-04-28
5710627 Wavelength-scanning mechanism and method for spectrometer Masaru Inoue 1998-01-20
5521845 Analytical system for remote transmission of data Toshihide Sakai, Yasuhiro Nishikata 1996-05-28
5428443 Laser diffraction-type particle size distribution measuring method and apparatus Hiroyuki Kitamura, Yoshiaki Togawa 1995-06-27
5301007 Microscopic spectrometer 1994-04-05
5278413 Infrared microscopic spectrometer Tetsuji Yamaguchi, Kazuyuki Ikemoto 1994-01-11
5241362 Microscopic spectrometer with auxiliary imaging system Yasushi Nakata 1993-08-31
5229611 Infrared microscopic spectrometer using the attenuated total reflection method 1993-07-20
5159405 Multibeam interferometer for use in a Fourier transform spectrometer and a driving device for moving the mirrors used therein 1992-10-27
5136422 Reflective optical system for a microscopic spectrometer 1992-08-04