Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12253443 | Elemental analysis device for analyzing test sample having cleaning gas supply mechanism | Takahito Inoue | 2025-03-18 |
| 12228554 | Elemental analysis device | Takahito Inoue | 2025-02-18 |
| 12111254 | Sample analyzing apparatus | Takahito Inoue, Kyoji Shibuya | 2024-10-08 |
| 11270878 | Quadrupole mass spectrometer, quadrupole mass spectrometry method, and program storage medium storing program for quadrupole mass spectrometer | Kohei SASAI, Kazushi Sasakura, Toshihiro IKEYAMA, Takahito Inoue | 2022-03-08 |
| 10978285 | Element analysis device and element analysis method | Takahito Inoue, Kohei SASAI, Toshihiro IKEYAMA | 2021-04-13 |
| 8102524 | Degree-of-dispersion determination method for single-walled carbon nanotubes and degree-of-dispersion determination apparatus for single-walled carbon nanotubes | Yasushi Nakata | 2012-01-24 |
| 7387764 | Contained oxygen analyzing apparatus and contained analyzing method | Masahiko Ikeda | 2008-06-17 |
| 6516654 | Apparatus and method for analyzing particulate matter in gas and apparatus and method for carbon differentiating | Junji Okayama, Atsushi Bando, Masahiko Ikeda, Masayuki Adachi, Ichiro Asano +1 more | 2003-02-11 |
| 4800747 | Method of measuring oxygen in silicon | Katsuya Tsuji, Takeshi Yamada | 1989-01-31 |