TC

Tai Wai David Chik

HL Hong Kong Applied Science And Technology Research Institute Company Limited: 1 patents #320 of 702Top 50%
Overall (All Time): #2,521,616 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
12063442 Optimized path planning for defect inspection based on effective region coverage Chi Shing Wong 2024-08-13