Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4975800 | Contact abnormality detecting system | Youichi Oshita, Akira Hashimoto, Yukio Kurosawa, Tokio Yamagiwa | 1990-12-04 |
| 4564754 | Method and apparatus for optically measuring a current | Tadashi Sato, Genji Takahashi | 1986-01-14 |