Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5581698 | Semiconductor integrated circuit device with test mode for testing CPU using external Signal | Yoshiyuki Miwa, Haruo Keida, Kunihiko Nakada, Hajime Yasuda | 1996-12-03 |
| 5228139 | Semiconductor integrated circuit device with test mode for testing CPU using external signal | Yoshiyuki Miwa, Haruo Keida, Kunihiko Nakada, Hajime Yasuda | 1993-07-13 |