TY

Toshikazu Yasuye

HI Hitachi: 1 patents #17,742 of 28,497Top 65%
Overall (All Time): #4,074,437 of 4,157,543Top 100%
1
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Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4345312 Method and device for inspecting the defect of a pattern represented on an article Seiji Kashioka, Yoshihiro Shima 1982-08-17