TF

Toshihiro Furuya

HI Hitachi: 12 patents #3,472 of 28,497Top 15%
JU Juki: 1 patents #119 of 281Top 45%
📍 Hitachinaka, JP: #399 of 2,447 inventorsTop 20%
Overall (All Time): #391,247 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
5010834 Clutch type roller feed for a sewing machine needle thread Ikuro Iimuro, Toshiki Matsushita 1991-04-30
5001344 Scanning electron microscope and method of processing the same Makoto Kato, Koichi Homma, Fuminobu Komura, Shinobu Otsuka 1991-03-19
4912313 Method of measuring surface topography by using scanning electron microscope, and apparatus therefor Makoto Kato, Koichi Homma, Fuminobu Komura 1990-03-27
4912328 Apparatus for improving the signal-to-noise ratio of image signals in a scan-type imaging system Makoto Kato, Tetsuo Yokoyama, Juntaro Arima 1990-03-27
4907287 Image correction system for scanning electron microscope Koichi Homma, Fuminobu Komura, Tetsuo Yokoyama, Koichi Haruna, Hiromi Kashiwabara +3 more 1990-03-06
4835385 Method of measuring sectional shape and a system therefor Makoto Kato, Tetsuo Yokoyama 1989-05-30
4817178 Linear cursor representation method Kaoru Momose, Makoto Kato, Tetsuo Yokoyama 1989-03-28
4803358 Scanning electron microscope Makoto Kato, Koichi Homma, Fuminobu Komura 1989-02-07
4791294 Electron beam scanning method and scanning electron microscope 1988-12-13
4755047 Photometric stereoscopic shape measuring method Makoto Kato, Tetsuo Yokoyama, Kaoru Momose 1988-07-05
4733074 Sample surface structure measuring method Makoto Kato, Tetsuo Yokoyama, Jyuntaro Arima, Shimbu Yamagata, Mikihiko Oi 1988-03-22
4725730 System of automatically measuring sectional shape Makoto Kato, Tetsuo Yokoyama, Juntaro Arima, Shimbu Yamagata 1988-02-16
4385317 Specimen image display apparatus Osamu Yamada 1983-05-24