Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4912395 | Testable LSI device incorporating latch/shift registers and method of testing the same | Yoshio Sato, Yasushi Kohno | 1990-03-27 |
| 4743840 | Diagnosing method for logic circuits | Yoshio Sato, Shun Ishiyama | 1988-05-10 |