Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9410929 | Inspection device and inspection method | Hisashi Endo, Mitsuteru Inoue, Hiroyuki Takagi | 2016-08-09 |
| 7358721 | Eddy current flaw detection sensor and method | Akira Nishimizu, Masahiro Koike, Yoshiharu Abe, Yuuichi Narumi, Hirofumi Ouchi | 2008-04-15 |