Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5219765 | Method for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of the inspection to the device fabrication process | Toru Yoshida, Suguru Sakaguchi, Aizo Kaneda, Kooji Serizawa, Munehisa Kishimoto +3 more | 1993-06-15 |