Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6081115 | Method of measuring exchange force and method of evaluating magnetism using the exchange force | Koichi Mukasa, Kazuhisa Sueoka, Kohji Nakamura, Yuichi Tazuke, Hideo Hasegawa +1 more | 2000-06-27 |
| 6078174 | Apparatus for measuring exchange force | Koichi Mukasa, Kazuhisa Sueoka, Kohji Nakamura, Yuichi Tazuke, Hideo Hasegawa +1 more | 2000-06-20 |
| 4954770 | Spin-polarization detector | Hideo Matsuyama, Kazuyuki Koike | 1990-09-04 |
| 4658138 | Scanning electron microscope | Kazuyuki Koike | 1987-04-14 |