Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5038048 | Defect detection system and method for pattern to be inspected utilizing multiple-focus image signals | Shunji Maeda | 1991-08-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5038048 | Defect detection system and method for pattern to be inspected utilizing multiple-focus image signals | Shunji Maeda | 1991-08-06 |