Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5086227 | Secondary ion mass analyzing apparatus | Hiroshi Hirose, Hifumi Tamura | 1992-02-04 |
| 5008537 | Composite apparatus with secondary ion mass spectrometry instrument and scanning electron microscope | Hifumi Tamura, Issei Tobita, Hiroshi Iwamoto | 1991-04-16 |