Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12361541 | Measurement apparatus and measurement method | Takeshi Tanaka, Daisuke Fukui | 2025-07-15 |
| 11157821 | Traceability system and method for traceability | Qi XIU, Yoshiko Nagasaka, Keiro Muro | 2021-10-26 |
| 11113364 | Time series data analysis control method and analysis control device | Keiro Muro | 2021-09-07 |
| 10459730 | Analysis system and analysis method for executing analysis process with at least portions of time series data and analysis data as input data | Keiro Muro | 2019-10-29 |
| 10394626 | Event flow system and event flow control method | Keiro Muro | 2019-08-27 |
| 8352790 | Abnormality detection method, device and program | Yasuhide Mori, Tomohiro Nakamura, Katsuro Kikuchi | 2013-01-08 |
| 7641099 | Solder joint determination method, solder inspection method, and solder inspection device | Katsuhiko Mukai | 2010-01-05 |
| 7040526 | Electronic parts assembling and testing method, and electronic circuit baseboard manufactured by the method | Takashi Negishi, Katsuhiko Mukai | 2006-05-09 |