Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5041725 | Secondary ion mass spectrometry apparatus | — | 1991-08-20 |
| 4851673 | Secondary ion mass spectrometer | Hiroshi Iwamoto, Eisuke Mitani, Hiroyasu Shichi | 1989-07-25 |
| 4833331 | Method of holding an electrically insulating sample | Yoshinori Ikebe, Hifumi Tamura | 1989-05-23 |
| 4774433 | Apparatus for generating metal ions | Yoshinori Ikebe, Hifumi Tamura, Hiroyasu Shichi | 1988-09-27 |
| 4510387 | Ion micro-analysis | Hifumi Tamura | 1985-04-09 |