Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11898973 | XFR analyzer instrument | — | 2024-02-13 |
| 7474730 | Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser | Erkki Tapani Puusaari | 2009-01-06 |