Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7417816 | Surface analysis test with mixed ECC symbol | Yasuhiro Iihara, Masaki Kudoh, Junzoh Noda, Masahiro Shimizu | 2008-08-26 |
| 7333282 | Data storage device and data storage device control method | Kaoru Iseri, Atsushi Tobari, Yasuhiro Iihara | 2008-02-19 |