Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7767961 | Method for determining material interfacial and metrology information of a sample using atomic force microscopy | — | 2010-08-03 |
| 7129484 | Method for pattern recognition in energized charge particle beam wafer/slider inspection/measurement systems in presence of electrical charge | — | 2006-10-31 |