Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8820163 | Nondestructive inspection apparatus and nondestructive inspection method using guided wave | Masahiro Miki, Yoshiaki Nagashima, Masao Endou, Mitsuru Odakura | 2014-09-02 |
| 8091427 | Nondestructive inspection apparatus and nondestructive inspection method using guided wave | Masahiro Miki, Yoshiaki Nagashima, Masao Endou, Mitsuru Odakura | 2012-01-10 |