KM

Keiji Muraju

HC Hitachi Electronics Engineering Co.: 1 patents #61 of 175Top 35%
📍 Honjō, JP: #51 of 78 inventorsTop 70%
Overall (All Time): #3,536,286 of 4,157,543Top 90%
1
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6348810 Interface unit for a tester and method of connecting a tester with a semiconductor device to be tested Makoto Yanagawa, Yuji Wada 2002-02-19