Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6448800 | Load current output circuit for electronic device and IC tester using the same load current output circuit | Keiichi Yamamoto, Yoshihiko Hayashi | 2002-09-10 |
| 6424201 | Diode element circuit and switch circuit using the same | Keiichi Yamamoto, Yoshihiko Hayashi | 2002-07-23 |
| 6275023 | Semiconductor device tester and method for testing semiconductor device | Yoshihiko Hayashi | 2001-08-14 |