TO

Takahiro Ogawara

HK Hioki Denki Kabushiki Kaisha: 1 patents #19 of 64Top 30%
Overall (All Time): #2,966,395 of 4,157,543Top 75%
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Patent #TitleCo-InventorsDate
9772352 Prober having linkage portion, method for manufacturing the prober and method of testing circuit boards using the prober Masashi Kobayashi 2017-09-26