Zhanwei Chen — 21 Patents at Here Global B.V.

Zhanwei Chen has been granted 21 US patents while listed as an inventor at Here Global B.V.. The first was granted in 2019 and the most recent in October 2025. Zhanwei Chen ranks #201,324 of 4,157,543 US inventors in our database (top 4.8%). Patent records list Zhanwei Chen in Oakland, CA, US.

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #	Title	Co-Inventors	Date
12438893	Method for detecting data stealthy attack on networked system with differential privacy protection	Mianmian Yang, Fazong Wu, Xiaoming Wu, Xin Wang, Chenggang Mu +1 more	2025-10-07
12008786	Method, apparatus, and computer program product for point-to-point translation between images	David Lawlor, Niranjan Kotha	2024-06-11
11580755	Method, apparatus, and system for determining polyline homogeneity	Anish Mittal, Richard L. Kwant, Himaanshu Gupta, David Lawlor	2023-02-14
11549816	Systems and methods for controlling mapping information inaccuracies	David Lawlor, Anish Mittal	2023-01-10
11501104	Method, apparatus, and system for providing image labeling for cross view alignment	Alex Ung, Anish Mittal, Nicholas POJMAN, David Lawlor	2022-11-15
11449768	Method, apparatus, and system for providing a redundant feature detection engine	Richard L. Kwant, Anish Mittal, David Lawlor, Himaanshu Gupta	2022-09-20
11410074	Method, apparatus, and system for providing a location-aware evaluation of a machine learning model	Richard L. Kwant, Anish Mittal, David Lawlor, Himaanshu Gupta	2022-08-09
11361490	Attention guidance for ground control labeling in street view imagery	Nick Pojman, David Lawlor	2022-06-14
11263726	Method, apparatus, and system for task driven approaches to super resolution	Abinaya Manimaran, Krishna Kumar Balakrishnan, David Lawlor, Anish Mittal	2022-03-01
11215462	Method, apparatus, and system for location correction based on feature point correspondence	Anish Mittal, David Lawlor, Peter Christian	2022-01-04
11182607	Method, apparatus, and system for determining a ground control point from image data using machine learning	Nicholas POJMAN, Anish Mittal, David Lawlor	2021-11-23
11113839	Method, apparatus, and system for feature point detection	Anish Mittal	2021-09-07
11087469	Method, apparatus, and system for constructing a polyline from line segments	Anish Mittal, David Lawlor, Himaanshu Gupta	2021-08-10
11055862	Method, apparatus, and system for generating feature correspondence between image views	Anish Mittal, Joseph C. Kurian	2021-07-06
11023747	Method, apparatus, and system for detecting degraded ground paint in an image	Nicholas POJMAN, Anish Mittal, David Lawlor	2021-06-01
10984552	Method, apparatus, and system for recommending ground control points for image correction	David Lawlor, Anish Mittal	2021-04-20
10970597	Method, apparatus, and system for priority ranking of satellite images	David Lawlor, Anish Mittal	2021-04-06
10949707	Method, apparatus, and system for generating feature correspondence from camera geometry	Anish Mittal, David Lawlor, Krishna Kumar Balakrishnan	2021-03-16
10789487	Method, apparatus, and system for determining polyline homogeneity	Anish Mittal, Richard L. Kwant, Himaanshu Gupta, David Lawlor	2020-09-29
10535006	Method, apparatus, and system for providing a redundant feature detection engine	Richard L. Kwant, Anish Mittal, David Lawlor, Himaanshu Gupta	2020-01-14
10515293	Method, apparatus, and system for providing skip areas for machine learning	Richard L. Kwant, Anish Mittal, David Lawlor, Himaanshu Gupta	2019-12-24

Zhanwei Chen — 21 Patents

Issued Patents All Time

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