Issued Patents All Time
Showing 26–50 of 125 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6704110 | Method and apparatus for measuring internal information of scattering medium | — | 2004-03-09 |
| 6567165 | Concentration measuring method and apparatus for absorption component in scattering medium | Tsuneyuki Urakami | 2003-05-20 |
| 6335792 | Method and apparatus for measuring internal property distribution in scattering medium | — | 2002-01-01 |
| 6240305 | Method and apparatus for measuring absorption information of a scattering medium | — | 2001-05-29 |
| 6236871 | Absorption information measuring method and apparatus of scattering medium | — | 2001-05-22 |
| 6233470 | Absorption information measuring method and apparatus of scattering medium | — | 2001-05-15 |
| 6104946 | Measuring method and apparatus of absorption information of scattering medium | Yutaka Yamashita | 2000-08-15 |
| 6075610 | Method and apparatus for measuring internal property distribution | Yukio Ueda, Kazuyoshi Ohta | 2000-06-13 |
| 6025895 | Liquid crystal display with mutually oriented and dispersed birefringent polymer and liquid crystal and random oriented twist alignment | Masayuki Yazaki, Hidekazu Kobayashi, Shuhei Yamada, Hidehito Iisaka, Eiji Chino | 2000-02-15 |
| 5983121 | Absorption information measuring method and apparatus of scattering medium | — | 1999-11-09 |
| 5972240 | Liquid crystal composite material and liquid crystal display device(s) which use them | Hidekazu Kobayashi, Shuhei Yamada, Eiji Chino, Masayuki Yazaki, Hidehito Iisaka | 1999-10-26 |
| 5872607 | Liquid crystal display device and method for producing such | Masayuki Yazaki, Hidekazu Kobayashi, Shuhei Yamada, Hidehito Iisaka, Eiji Chino | 1999-02-16 |
| 5867237 | Polymer dispersed liquid crystal display device and method of producing a display device | Masayuki Yazaki, Hidekazu Kobayashi, Shuhei Yamada, Hidehito Iisaka, Eiji Chino | 1999-02-02 |
| 5836883 | Measuring the characteristics of a scattering medium | Yutaka Yamashita | 1998-11-17 |
| 5815519 | Ultrashort pulse laser apparatus | Shinichiro Aoshima, Haruyasu Ito | 1998-09-29 |
| 5772588 | Apparatus and method for measuring a scattering medium | Mitsuharu Miwa | 1998-06-30 |
| 5774223 | Optical measuring method and an optical measuring apparatus for determining the internal structure of an object | Tsuneyuki Urakami, Mitsuharu Miwa, Yutaka Yamashita | 1998-06-30 |
| 5767688 | Electro-optic voltage measurement apparatus | Hironori Takahashi, Takeshi Kamiya | 1998-06-16 |
| 5694931 | Method and apparatus for measuring concentration of absorptive constituent in scattering medium | — | 1997-12-09 |
| 5676142 | Method and apparatus for measuring scattering property and absorption property in scattering medium | Mitsuharu Miwa, Yukio Ueda | 1997-10-14 |
| 5640247 | Method for measuring internal information in a scattering medium and apparatus for the same | Kazuyoshi Ohta, Tsuneyuki Urakami | 1997-06-17 |
| 5625296 | Electro-optic voltage measurement apparatus | Hironori Takahashi, Takeshi Kamiya | 1997-04-29 |
| 5552716 | Method of positioning an electrooptic probe of an apparatus for the measurement of voltage | Hironori Takahashi, Shinichiro Aoshima, Isuke Hirano | 1996-09-03 |
| 5529065 | Method for measuring scattering medium and apparatus for the same | — | 1996-06-25 |
| 5517987 | Method for measuring internal information in scattering medium and apparatus for the same | — | 1996-05-21 |