Issued Patents All Time
Showing 76–100 of 121 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7500847 | Die for forming honeycomb structure and method of manufacturing the same | Hirofumi Hosokawa, Yoshimasa Kondo, Masayuki Hironaga | 2009-03-10 |
| 7460228 | Fast particle generating apparatus | Masatoshi Fujimoto, Shin-Ichiro Aoshima | 2008-12-02 |
| 7189976 | Method for generating high-speed particle and system for generating high-speed particle | Takashi Inoue, Shinji Ohsuka, Yutaka Tsuchiya | 2007-03-13 |
| 6747736 | Terahertz wave spectrometer | — | 2004-06-08 |
| 6690165 | Magnetic-field sensing coil embedded in ceramic for measuring ambient magnetic field | — | 2004-02-10 |
| 6658223 | Toner seal for a cleaning device | Ryoji Nishimura, Shinsuke Kawashima, Tsuyoshi Koyanagi, Satoru Yonemoto, Yuzo Onishi | 2003-12-02 |
| 5896035 | Electric field measuring apparatus | — | 1999-04-20 |
| 5847570 | Low jitter trigger circuit for electro-optic probing apparatus | Takuya Nakamura | 1998-12-08 |
| 5767688 | Electro-optic voltage measurement apparatus | Yutaka Tsuchiya, Takeshi Kamiya | 1998-06-16 |
| 5751419 | Optical delay apparatus | Shinichiro Aoshima | 1998-05-12 |
| 5703491 | Voltage detection apparatus | Takuya Nakamura, Isuke Hirano, Shinichiro Aoshima, Tsuneyuki Urakami | 1997-12-30 |
| 5666062 | Voltage measuring using electro-optic material's change in refractive index | Kazuhiko Wakamori, Musubu Koishi, Akira Takeshima | 1997-09-09 |
| 5642040 | Electrooptic probe for measuring voltage of an object having a high permittivity film fixed on an end face of a reflecting film fixed on an electrooptic material | Kazuhiko Wakamori | 1997-06-24 |
| 5631555 | Voltage measurement system | Musubu Koishi, Akira Takeshima | 1997-05-20 |
| 5625296 | Electro-optic voltage measurement apparatus | Yutaka Tsuchiya, Takeshi Kamiya | 1997-04-29 |
| 5621521 | Checking apparatus for array electrode substrate | — | 1997-04-15 |
| 5592101 | Electro-optic apparatus for measuring an electric field of a sample | Shinichiro Aoshima, Isuke Hirano | 1997-01-07 |
| 5585735 | E-O probe with FOP and voltage detecting apparatus using the E-O probe | Teruo Hiruma | 1996-12-17 |
| 5583444 | Voltage detection apparatus | Takuya Nakamura, Isuke Hirano, Shinichiro Aoshima, Tsuneyuki Urakami | 1996-12-10 |
| 5552716 | Method of positioning an electrooptic probe of an apparatus for the measurement of voltage | Shinichiro Aoshima, Isuke Hirano, Yutaka Tsuchiya | 1996-09-03 |
| 5546011 | Voltage measuring apparatus | Shinichiro Aoshima | 1996-08-13 |
| 5500587 | E-O probe | Shinichiro Aoshima, Isuke Hirano | 1996-03-19 |
| 5499190 | System for measuring timing relationship between two signals | Tsuneyuki Urakami, Shinichiro Aoshima, Isuke Hirano | 1996-03-12 |
| 5479106 | Electro-optic voltage detector | Shinichiro Aoshima, Yutaka Tsuchiya | 1995-12-26 |
| 5444365 | Voltage measuring apparatus having an electro-optic member | Tsuneyuki Urakami, Shinichiro Aoshima, Isuke Hirano | 1995-08-22 |