Issued Patents All Time
Showing 101–123 of 123 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4476981 | Rejection system | — | 1984-10-16 |
| 4451929 | Pattern discrimination method | — | 1984-05-29 |
| 4449240 | Pattern recognition system | — | 1984-05-15 |
| 4437115 | Object and inspection system | — | 1984-03-13 |
| 4428673 | Light diffusion device | — | 1984-01-31 |
| 4418341 | Noise detection apparatus | — | 1983-11-29 |
| 4408224 | Surveillance method and apparatus | — | 1983-10-04 |
| 4403858 | Defect inspection system | — | 1983-09-13 |
| 4379636 | Inspection device | — | 1983-04-12 |
| 4330712 | Inspection apparatus for defects on patterns | — | 1982-05-18 |
| 4318080 | Data processing system utilizing analog memories having different data processing characteristics | — | 1982-03-02 |
| 4318081 | Object inspection system | — | 1982-03-02 |
| 4314279 | Matrix array camera | — | 1982-02-02 |
| 4305658 | Moving object inspection system | — | 1981-12-15 |
| 4302773 | Defect inspection system | — | 1981-11-24 |
| 4295120 | Pattern data processing method and apparatus to practice such method | — | 1981-10-13 |
| 4284353 | Flaw detecting apparatus | Takashi Aoki, Kei NISHIDA | 1981-08-18 |
| 4277802 | Defect inspection system | — | 1981-07-07 |
| 4259662 | Threshold setting circuit | — | 1981-03-31 |
| 4246606 | Inspection apparatus | — | 1981-01-20 |
| 4240107 | Apparatus and method for pattern information processing | — | 1980-12-16 |
| 4223790 | Container inspection system | — | 1980-09-23 |
| 4218673 | Pattern matching method and such operation system | — | 1980-08-19 |