Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4704576 | Microwave measuring and apparatus for contactless non-destructive testing of photosensitive materials | Helmut Tributsch, Gerhard Beck | 1987-11-03 |
| 4700311 | System for optimizing process parameters in photoactive semiconductor manufacturing in-situ | Helmut Tributsch, Gerhard Beck, Udo Kuppers, Hans-Joachim Lewerenz, Jochen Lilie +1 more | 1987-10-13 |