JC

Jyh-Shin Chen

General Motors: 23 patents #536 of 18,328Top 3%
NL National Applied Research Laboratories: 2 patents #112 of 506Top 25%
PC Precision Instrument Development Center: 1 patents #2 of 17Top 15%
NU National Tsing Hua University: 1 patents #672 of 2,036Top 35%
NC National Science Council: 1 patents #238 of 867Top 30%
IC Instrument Technology Research Center: 1 patents #6 of 21Top 30%
📍 Troy, MI: #88 of 2,712 inventorsTop 4%
🗺 Michigan: #1,777 of 86,293 inventorsTop 3%
Overall (All Time): #102,996 of 4,157,543Top 3%
34
Patents All Time

Issued Patents All Time

Showing 26–34 of 34 patents

Patent #TitleCo-InventorsDate
7360615 Predictive energy management system for hybrid electric vehicles Mutasim A. Salman, Man-Feng Chang 2008-04-22
7319284 Surface acoustic wave device and method for fabricating the same Sheng-Wen Chen, Hui-Ling Kao, Yu-Sheng Kung, Yu-Hsin Lin, Yi-Chiuen Hu 2008-01-15
7295902 Torque management algorithm for hybrid electric vehicles Mutasim A. Salman, Man-Feng Chang 2007-11-13
7149395 Light-enhancing component and fabrication method thereof Tong-Long Fu, Shao-Chang Cheng, Yu-Hsuan Lin, Yi-Chiuen Hu, Hui-Hsiung Lin +1 more 2006-12-12
6514814 Capacitor containing amorphous and polycrystalline ferroelectric films and fabrication method therefor, and method for forming amorphous ferroelectric film Cheng-Chung Jaing, Jen-Inn Chyi, Jeng-Jiing Sheu 2003-02-04
6503578 Method for preparing ZnSe thin films by ion-assisted continuous wave CO2 laser deposition Pey-Shiun Yeh, Cheng-Chung Jaing, Hsiang-Ming Tseng, Long-Sheng Liao, Ming-Chih Lee 2003-01-07
6493070 Method for in-situ monitoring layer uniformity of sputter coating based on intensity distribution of plasma spectrum Cheng-Chung Jaing, Chuen-Horng Tsai, Ming-Hwu Cheng, Ho-Yen Hsiao, Py-Shiun Yeh +1 more 2002-12-10
6309895 Method for fabricating capacitor containing amorphous and polycrystalline ferroelectric films and method for forming amorphous ferroelectric film Cheng-Chung Jaing, Jen-Inn Chyi, Jeng-Jiing Sheu 2001-10-30
5381233 Polarized-light scatterometer for measuring the thickness of a film coated on the partial of a substrate Shiuh Chao, Tsai-Chu Hsiao 1995-01-10