Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11538721 | Evaluation method of metal contamination | Takeshi Onozuka, Tomoyuki Ishihara | 2022-12-27 |
| 11060983 | Evaluation method of silicon wafer | Haruo Sudo, Kazuki Okabe, Koji Araki | 2021-07-13 |