Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10649026 | Apparatus for and method of net trace prior level subtraction | Oliver D. Patterson, Peter Lin | 2020-05-12 |
| 10234500 | Systematic defects inspection method with combined eBeam inspection and net tracing classification | Xuefeng Zeng, Yan Pan, Peter Lin, Hoang Anh Nguyen, Ho-Young Song | 2019-03-19 |