Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12243703 | Probe card device and circuit protection assembly thereof | Yu-Min Sun, Chih-Feng Cheng | 2025-03-04 |
| 12140623 | Testing apparatus | Yu-Min Sun, Chih-Feng Cheng | 2024-11-12 |
| 11852470 | Inspecting device | Yu-Min Sun, Chih-Feng Cheng | 2023-12-26 |
| 11848250 | Thermal peak suppression device | Chih-Feng Cheng, Yu-Min Sun | 2023-12-19 |
| 11740260 | Pogo pin-free testing device for IC chip test and testing method of IC chip | Yu-Min Sun, Chih-Feng Cheng, Pei-Shiou Huang | 2023-08-29 |
| 11703244 | Testing apparatus | Yu-Min Sun, Chih-Feng Cheng | 2023-07-18 |
| 11699457 | Testing system, crack noise monitoring device and method for monitoring crack noise | Chih-Feng Cheng, Yu-Min Sun | 2023-07-11 |
| 11624759 | Inspecting device and its testing socket | Chih-Feng Cheng, Yu-Min Sun | 2023-04-11 |
| 11340288 | Testing equipment, its component carrying device and testing method of the testing equipment | Chih-Feng Cheng, Yu-Min Sun | 2022-05-24 |
| 11156639 | Probe card module | Yu-Min Sun, Chih-Feng Cheng | 2021-10-26 |
| 10598724 | Testing system for semiconductor package components and its thermal barrier layer element | Yu-Min Sun, Chih-Feng Cheng | 2020-03-24 |
| 10566217 | Drying apparatus | Yu-Min Sun, Chih-Feng Cheng | 2020-02-18 |
| 10502775 | Testing equipment for semiconductor element and its carrying device | Yu-Min Sun, Chih-Feng Cheng | 2019-12-10 |
| 10332765 | Wafer shipping device | Chu-Fang Chih, Chia-Jen Kao | 2019-06-25 |
| 10274516 | Probe card system, probe loader device and manufacturing method of the probe loader device | Yu-Min Sun, Chih-Feng Cheng | 2019-04-30 |
| 10154612 | Electronic device having active heat dissipation | Yu-Min Sun, Chih-Feng Cheng | 2018-12-11 |
| 10132835 | Testing apparatus and its probe connector | Yu-Min Sun, Chih-Feng Cheng | 2018-11-20 |
| 10048290 | Probe card device | Yu-Min Sun, Chih-Feng Cheng | 2018-08-14 |
| 10041817 | Damping component and integrated-circuit testing apparatus using the same | Yu-Min Sun, Chih-Feng Cheng | 2018-08-07 |
| 9678110 | Probe card | Yu-Min Sun, Chih-Feng Cheng | 2017-06-13 |