Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5723337 | Method for measuring and controlling the oxygen concentration in silicon melts and apparatus therefor | Georg Muller, Albrecht Seidl | 1998-03-03 |
| 4426717 | Measuring apparatus for X-ray fluorescence analysis | Joachim Schwenke, Joachim Knoth, Herbert Rosomm | 1984-01-17 |
| 4358854 | Measuring devices for X-ray fluorescence analysis | Herbert Rosomm, Heinrich Schwenke | 1982-11-09 |