Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8828852 | Delta-doping at wafer level for high throughput, high yield fabrication of silicon imaging arrays | Michael E. Hoenk, Shoulch Nikzad, Todd J. Jones, Frank Greer | 2014-09-09 |
| 8377518 | In-situ flux measurement devices, methods, and systems | W. Alan Doolittle | 2013-02-19 |
| 8360002 | In-situ flux measurement devices, methods, and systems | W. Alan Doolittle | 2013-01-29 |
| 8261690 | In-situ flux measurement devices, methods, and systems | W. Alan Doolittle | 2012-09-11 |