XY

Xingwei Yang

GE: 4 patents #8,224 of 36,430Top 25%
Overall (All Time): #1,175,240 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10481108 System for defect indication detection Andrew Frank Ferro, Paulo Ricardo Mendonca, Christopher Allen Nafis, Patrick Joseph Howard 2019-11-19
10203290 Method for defect indication detection Andrew Frank Ferro, Paulo Ricardo Mendonca, Christopher Allen Nafis, Patrick Joseph Howard 2019-02-12
9305345 System and method for image based inspection of an object Ser Nam Lim, Jose Abiel Garza, David Scott Diwinsky, Li Guan, Shubao Liu +1 more 2016-04-05
9251582 Methods and systems for enhanced automated visual inspection of a physical asset Ser Nam Lim, Vinod Padmanabhan Kumar, Russell Robert Irving, John Brandon Laflen, Li Guan +1 more 2016-02-02